May 10,Dean of Institute of Information Technology and Electrical Engineering, professor YU Wenxian led a visit to Shanghai institute of Measurement and Testing Technology(SIMT), and communicated with its vice dean Lu Min, director Lai Lei on personnel training, project cooperation and other aspects.

Shanghai institute of Measurement and Testing Technology (SIMT) is one of the earliest established metrology professional organizations in China, the only authorized by the state public welfare, comprehensive national legal metrology institutes in Shanghai. The visit aims to strengthen bilateral exchanges between the collision cooperation.

First, Dean Yu responded positively to joint PhD needs proposed by SIMT. SJTU are also glad and have the ability to cultivate scarce talented SIMT needs.

Second, both sides agreed on building a navigation standard test data services platform, and EMC Software Evaluation Center and other projects. Substantive follow-up work will also begin immediately.